Ben Gu, Kiran K. Gullapalli, Yun Zhang, Savithri Sundareswaran. Faster statistical cell characterization using adjoint sensitivity analysis. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 229-232, IEEE, 2008. [doi]
Abstract is missing.