Junjun Gu, Gang Qu, Lin Yuan, Cheng Zhuo. Improving dual Vt technology by simultaneous gate sizing and mechanical stress optimization. In 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), San Jose, California, USA, November 7-10, 2011. pages 732-735, IEEE, 2011. [doi]
Abstract is missing.