Design and analysis of test schemes for algorithm-based fault tolerance - researchr publication authors

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Dechang Gu, Daniel J. Rosenkrantz, S. S. Ravi. Design and analysis of test schemes for algorithm-based fault tolerance. In Proceedings of the 20th International Symposium on Fault-Tolerant Computing, FTCS 1990, Newcastle Upon Tyne, UK, 26-28 June, 1990. pages 106-113, IEEE Computer Society, 1990. [doi]

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