Dechang Gu, Daniel J. Rosenkrantz, S. S. Ravi. Design and analysis of test schemes for algorithm-based fault tolerance. In Proceedings of the 20th International Symposium on Fault-Tolerant Computing, FTCS 1990, Newcastle Upon Tyne, UK, 26-28 June, 1990. pages 106-113, IEEE Computer Society, 1990. [doi]
@inproceedings{GuRR90,
title = {Design and analysis of test schemes for algorithm-based fault tolerance},
author = {Dechang Gu and Daniel J. Rosenkrantz and S. S. Ravi},
year = {1990},
doi = {10.1109/FTCS.1990.89341},
url = {http://dx.doi.org/10.1109/FTCS.1990.89341},
researchr = {https://researchr.org/publication/GuRR90},
cites = {0},
citedby = {0},
pages = {106-113},
booktitle = {Proceedings of the 20th International Symposium on Fault-Tolerant Computing, FTCS 1990, Newcastle Upon Tyne, UK, 26-28 June, 1990},
publisher = {IEEE Computer Society},
isbn = {0-8186-2051-X},
}