Valerio Guarnieri, Franco Fummi, Krishnendu Chakrabarty. Reduced-Complexity Transition-Fault Test Generation for Non-scan Circuits through High-Level Mutant Injection. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 302-307, IEEE Computer Society, 2012. [doi]
Abstract is missing.