Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin. Application of non-parametric statistics of the parametric response for defect diagnosis. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]
Abstract is missing.