N. Guenifi, F. Djahli, A. Mayouf. Relation between MOSFET degradation and interface-states generation. In Proceedings of the 2000 7th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2000, Jounieh, Lebanon, December 17-20, 2000. pages 936-939, IEEE, 2000. [doi]
Abstract is missing.