Daniel W. Gulick, Yuna Jung, Seunghyun Lee, Sule Ozev, Jennifer Blain Christen. Exploring Model-based Failure Prediction of Passive Bio-electro-mechanical Implants. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]
@inproceedings{GulickJLOC22,
title = {Exploring Model-based Failure Prediction of Passive Bio-electro-mechanical Implants},
author = {Daniel W. Gulick and Yuna Jung and Seunghyun Lee and Sule Ozev and Jennifer Blain Christen},
year = {2022},
doi = {10.1109/VTS52500.2021.9794142},
url = {https://doi.org/10.1109/VTS52500.2021.9794142},
researchr = {https://researchr.org/publication/GulickJLOC22},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022},
publisher = {IEEE},
isbn = {978-1-6654-1060-1},
}