Daniel W. Gulick, Yuna Jung, Seunghyun Lee, Sule Ozev, Jennifer Blain Christen. Exploring Model-based Failure Prediction of Passive Bio-electro-mechanical Implants. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]
Abstract is missing.