Anil Kumar Gundu, Mohammad S. Hashmi, Ramkesh Sharma, Naushad Ansari. Statistical analysis and parametric yield estimation of standard 6T SRAM cell for different capacities. In 28th IEEE International System-on-Chip Conference, SOCC 2015, Beijing, China, September 8-11, 2015. pages 316-321, IEEE, 2015. [doi]
Abstract is missing.