José Luís Güntzel, Gustavo Wilke, Márcio Bystronski, Ana Cristina Medina Pinto, Ricardo Reis 0001. A Comparison Between Testability Measures Applied to Complex Gates. In 3rd Latin American Test Workshop, LATW 2002, Montevideo, Uruguay, February 10-13, 2002. pages 144-149, IEEE, 2002.
Abstract is missing.