Zhen Guo. How to reduce aliasing in linear analog testing. In David Garrett, John Lach, Charles A. Zukowski, editors, Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, Boston, MA, USA, April 26-28, 2004. pages 368-371, ACM, 2004. [doi]
@inproceedings{Guo04:4,
title = {How to reduce aliasing in linear analog testing},
author = {Zhen Guo},
year = {2004},
doi = {10.1145/988952.989041},
url = {http://doi.acm.org/10.1145/988952.989041},
tags = {testing},
researchr = {https://researchr.org/publication/Guo04%3A4},
cites = {0},
citedby = {0},
pages = {368-371},
booktitle = {Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, Boston, MA, USA, April 26-28, 2004},
editor = {David Garrett and John Lach and Charles A. Zukowski},
publisher = {ACM},
isbn = {1-58113-853-9},
}