How to reduce aliasing in linear analog testing

Zhen Guo. How to reduce aliasing in linear analog testing. In David Garrett, John Lach, Charles A. Zukowski, editors, Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, Boston, MA, USA, April 26-28, 2004. pages 368-371, ACM, 2004. [doi]

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