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Zhen Guo. How to reduce aliasing in linear analog testing. In David Garrett, John Lach, Charles A. Zukowski, editors, Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, Boston, MA, USA, April 26-28, 2004. pages 368-371, ACM, 2004. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: On Test and Characterization of Analog Linear Time-Invariant Circuits Using Neural NetworksZhen Guo, Xi Min Zhang, Jacob Savir, Yun-Qing Shi. ats 2001: 338-343 [doi]
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