Zhen Guo, Xi Min Zhang, Jacob Savir, Yun-Qing Shi. On Test and Characterization of Analog Linear Time-Invariant Circuits Using Neural Networks. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 338-343, IEEE Computer Society, 2001. [doi]
Abstract is missing.