Ruifeng Guo, Wu-Tung Cheng, Kun-Han Tsai. Speed-Path Debug Using At-Speed Scan Test Patterns. In 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009. pages 11-16, IEEE Computer Society, 2009. [doi]
@inproceedings{GuoCT09-0,
title = {Speed-Path Debug Using At-Speed Scan Test Patterns},
author = {Ruifeng Guo and Wu-Tung Cheng and Kun-Han Tsai},
year = {2009},
doi = {10.1109/ETS.2009.12},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2009.12},
tags = {testing, debugging},
researchr = {https://researchr.org/publication/GuoCT09-0},
cites = {0},
citedby = {0},
pages = {11-16},
booktitle = {14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3703-0},
}