Xiaofei Guo, Naghmeh Karimi, Francesco Regazzoni, Chenglu Jin, Ramesh Karri. Simulation and analysis of negative-bias temperature instability aging on power analysis attacks. In IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2015, Washington, DC, USA, 5-7 May, 2015. pages 124-129, IEEE, 2015. [doi]
Abstract is missing.