A Highly Reliable RRAM-Based 12T2R NVSRAM Architecture With Dual-Layer ECC

Huimeng Guo, Yujia Li, Yiqing Li, Tingrui Ren, Liang Wang 0024, Yuanfu Zhao. A Highly Reliable RRAM-Based 12T2R NVSRAM Architecture With Dual-Layer ECC. IEEE Trans. VLSI Syst., 34(1):294-306, January 2026. [doi]

Abstract

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