Shaofeng Guo, Zhenghan Lin, Runsheng Wang, Zexuan Zhang, Zhe Zhang, Yangyuan Wang, Ru Huang. Investigation on the amplitude coupling effect of random telegraph noise (RTN) in nanoscale FinFETs. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 6-1, IEEE, 2018. [doi]
Abstract is missing.