Analog Circuit Test using Transfer Function Coe .cient Estimates - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Zhen Guo, Jacob Savir. Analog Circuit Test using Transfer Function Coe .cient Estimates. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1155-1163, IEEE Computer Society, 2003. [doi]

This author has not been identified. Look up 'Zhen Guo' in GoogleThis author has not been identified. Look up 'Jacob Savir' in Google

runs on WebDSL