Analog Circuit Test using Transfer Function Coe .cient Estimates - researchr publication related

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Zhen Guo, Jacob Savir. Analog Circuit Test using Transfer Function Coe .cient Estimates. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1155-1163, IEEE Computer Society, 2003. [doi]

The following publications are possibly variants of this publication:

Analog Circuit Test Using Transfer Function Coefficient EstimatesZhen Guo, Jacob Savir. ieicet, 87-D(3):642-646, 2004. [doi]

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