Zhen Guo, Jacob Savir. Analog Circuit Test using Transfer Function Coe .cient Estimates. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1155-1163, IEEE Computer Society, 2003. [doi]
@inproceedings{GuoS03,
title = {Analog Circuit Test using Transfer Function Coe .cient Estimates},
author = {Zhen Guo and Jacob Savir},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20631155abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/GuoS03},
cites = {0},
citedby = {0},
pages = {1155-1163},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}