Hao Guo, Sayandeep Saha, Vasudev Gohil, Satwik Patnaik, Debdeep Mukhopadhyay, Jeyavijayan (JV) Rajendran. ExploreFault: Identifying Exploitable Fault Models in Block Ciphers with Reinforcement Learning. In 60th ACM/IEEE Design Automation Conference, DAC 2023, San Francisco, CA, USA, July 9-13, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.