Xiaohui Guo, Xu Yan, Shimin Ma, Xinyi Zhang, Ziaho Yan, Anqi Zhang, Kai Xu, Liangping Hua, Yan Du, Hao Wang, Yuxin Shu, Weiqiang Hong, Yunong Zhao, Yaohua Xu. Wavelet decomposition and reconstruction-based INL method for testing high-precision ADC. Microelectronics Journal, 142:105945, December 2023. [doi]
@article{GuoYMZYZXHDWSHZX23,
title = {Wavelet decomposition and reconstruction-based INL method for testing high-precision ADC},
author = {Xiaohui Guo and Xu Yan and Shimin Ma and Xinyi Zhang and Ziaho Yan and Anqi Zhang and Kai Xu and Liangping Hua and Yan Du and Hao Wang and Yuxin Shu and Weiqiang Hong and Yunong Zhao and Yaohua Xu},
year = {2023},
month = {December},
doi = {10.1016/j.mejo.2023.105945},
url = {https://doi.org/10.1016/j.mejo.2023.105945},
researchr = {https://researchr.org/publication/GuoYMZYZXHDWSHZX23},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {142},
pages = {105945},
}