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Wavelet decomposition and reconstruction-based INL method for testing high-precision ADC

Xiaohui Guo, Xu Yan, Shimin Ma, Xinyi Zhang, Ziaho Yan, Anqi Zhang, Kai Xu, Liangping Hua, Yan Du, Hao Wang, Yuxin Shu, Weiqiang Hong, Yunong Zhao, Yaohua Xu. Wavelet decomposition and reconstruction-based INL method for testing high-precision ADC. Microelectronics Journal, 142:105945, December 2023. [doi]

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