Xiaolong Guo, Huifeng Zhu, Yier Jin, Xuan Zhang. When Capacitors Attack: Formal Method Driven Design and Detection of Charge-Domain Trojans. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 1727-1732, IEEE, 2019. [doi]
Abstract is missing.