Neha Gupta, Lomash Chandra Acharya, Khoirom Johnson Singh, Mahipal Dargupally, Neeraj Mishra, Arvind Kumar Sharma, Ajoy Mandal, Ramakrishnan Venkatraman, Sudeb Dasgupta, Anand Bulusu. Aging-Aware Timing Models for Reliability Enhancement of Inverter-Transmission Gate-Based Circuits. IEEE Design & Test of Computers, 43(3):23-29, June 2026. [doi]
Abstract is missing.