Mohit Gupta, Kwangok Jeong, Andrew B. Kahng. Timing yield-aware color reassignment and detailed placement perturbation for double patterning lithography. In 2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA. pages 607-614, IEEE, 2009. [doi]
@inproceedings{GuptaJK09,
title = {Timing yield-aware color reassignment and detailed placement perturbation for double patterning lithography},
author = {Mohit Gupta and Kwangok Jeong and Andrew B. Kahng},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5361231},
tags = {context-aware},
researchr = {https://researchr.org/publication/GuptaJK09},
cites = {0},
citedby = {0},
pages = {607-614},
booktitle = {2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA},
publisher = {IEEE},
}