Mohit Gupta, Kwangok Jeong, Andrew B. Kahng. Timing yield-aware color reassignment and detailed placement perturbation for double patterning lithography. In 2009 International Conference on Computer-Aided Design (ICCAD 09), November 2-5, 2009, San Jose, CA, USA. pages 607-614, IEEE, 2009. [doi]
Abstract is missing.