Delay Fault Testing: How Robust are Our Models? - researchr publication authors

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Sandeep K. Gupta, Slawomir Pilarski, Sudhakar M. Reddy, Jacob Savir, Prab Varma. Delay Fault Testing: How Robust are Our Models?. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 502-503, IEEE Computer Society, 1996. [doi]

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