Sandeep K. Gupta, Slawomir Pilarski, Sudhakar M. Reddy, Jacob Savir, Prab Varma. Delay Fault Testing: How Robust are Our Models?. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 502-503, IEEE Computer Society, 1996. [doi]
@inproceedings{GuptaPRSV96,
title = {Delay Fault Testing: How Robust are Our Models?},
author = {Sandeep K. Gupta and Slawomir Pilarski and Sudhakar M. Reddy and Jacob Savir and Prab Varma},
year = {1996},
url = {http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040502.pdf},
tags = {testing},
researchr = {https://researchr.org/publication/GuptaPRSV96},
cites = {0},
citedby = {0},
pages = {502-503},
booktitle = {14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA},
publisher = {IEEE Computer Society},
}