S. Gurumurthy, D. Bertanzetti, P. Jakobsen, Jeff Rearick. Cache-resident self-testing for I/O circuitry. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-8, IEEE, 2009. [doi]
Abstract is missing.