A layout defect-sensitivity extractor - researchr publication authors

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José Pineda de Gyvez, Jochen A. G. Jess. A layout defect-sensitivity extractor. In 1989 IEEE International Conference on Computer-Aided Design, ICCAD 1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical Papers. pages 538-541, IEEE, 1989. [doi]

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