Wilson J. Pérez H., Ernesto Sánchez 0001, Matteo Sonza Reorda, Alberto Tonda, Jaime Velasco-Medina. Functional test generation for the pLRU replacement mechanism of embedded cache memories. In 12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011. pages 1-6, IEEE, 2011. [doi]
Abstract is missing.