Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system - researchr publication authors

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G. Haberfehlner, Scrgey Bychikhin, V. Dubec, Michael Heer, A. Podgaynaya, M. Pfost, M. Stecher, Erich Gornik, Dionyz Pogany. Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. Microelectronics Reliability, 49(9-11):1346-1351, 2009. [doi]

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