G. Haberfehlner, Scrgey Bychikhin, V. Dubec, Michael Heer, A. Podgaynaya, M. Pfost, M. Stecher, Erich Gornik, Dionyz Pogany. Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. Microelectronics Reliability, 49(9-11):1346-1351, 2009. [doi]
@article{HaberfehlnerBDHPPSGP09,
title = {Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system},
author = {G. Haberfehlner and Scrgey Bychikhin and V. Dubec and Michael Heer and A. Podgaynaya and M. Pfost and M. Stecher and Erich Gornik and Dionyz Pogany},
year = {2009},
doi = {10.1016/j.microrel.2009.07.032},
url = {http://dx.doi.org/10.1016/j.microrel.2009.07.032},
researchr = {https://researchr.org/publication/HaberfehlnerBDHPPSGP09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {9-11},
pages = {1346-1351},
}