Koutaro Hachiya. A Method to Detect Open Defects in Wire Segments of On-Chip Power Grids. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{Hachiya20,
title = {A Method to Detect Open Defects in Wire Segments of On-Chip Power Grids},
author = {Koutaro Hachiya},
year = {2020},
doi = {10.1109/ATS49688.2020.9301528},
url = {https://doi.org/10.1109/ATS49688.2020.9301528},
researchr = {https://researchr.org/publication/Hachiya20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020},
publisher = {IEEE},
isbn = {978-1-7281-7467-9},
}