A Method to Detect Open Defects in Wire Segments of On-Chip Power Grids

Koutaro Hachiya. A Method to Detect Open Defects in Wire Segments of On-Chip Power Grids. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-6, IEEE, 2020. [doi]

Abstract

Abstract is missing.