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Thomas Hackl, Mathias Poik, Georg Schitter. Single-Harmonic Response Open-Loop Kelvin-Probe Force Microscopy. IEEE T. Instrumentation and Measurement, 73:1-7, 2024. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force MicroscopyThomas Hackl, Mathias Poik, Georg Schitter. i2mtc 2022: 1-5 [doi] Heterodyne AC Kelvin Probe Force Microscopy for Nanoscale Surface Potential Imaging in LiquidsThomas Hackl, Mathias Poik, Georg Schitter. tim, 72:1-8, 2023. [doi]
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