A scan-chain based state retention methodology for IoT processors operating on intermittent energy

Pascal Alexander Hager, Hamed Fatemi, José Pineda de Gyvez, Luca Benini. A scan-chain based state retention methodology for IoT processors operating on intermittent energy. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 1171-1176, IEEE, 2017. [doi]

Abstract

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