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Thermal-Cycling-aware Dynamic Reliability Management in Many-Core System-on-Chip

Mohammad Hashem Haghbayan, Antonio Miele, Zhuo Zou, Hannu Tenhunen, Juha Plosila. Thermal-Cycling-aware Dynamic Reliability Management in Many-Core System-on-Chip. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 1229-1234, IEEE, 2020. [doi]

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Mohammad Hashem Haghbayan

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Antonio Miele

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Zhuo Zou

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Hannu Tenhunen

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Juha Plosila

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