Generating test patterns for sequential circuits using random patterns by PLI functions - researchr publication authors

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Mohammad Hashem Haghbayan, Alireza Yazdanpanah, Sara Karamati, Ramyar Saeedi, Zainalabedin Navabi. Generating test patterns for sequential circuits using random patterns by PLI functions. In 2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010. pages 456-461, IEEE, 2010. [doi]

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