Mohammad Hashem Haghbayan, Alireza Yazdanpanah, Sara Karamati, Ramyar Saeedi, Zainalabedin Navabi. Generating test patterns for sequential circuits using random patterns by PLI functions. In 2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010. pages 456-461, IEEE, 2010. [doi]
@inproceedings{HaghbayanYKSN10, title = {Generating test patterns for sequential circuits using random patterns by PLI functions}, author = {Mohammad Hashem Haghbayan and Alireza Yazdanpanah and Sara Karamati and Ramyar Saeedi and Zainalabedin Navabi}, year = {2010}, doi = {10.1109/EWDTS.2010.5742079}, url = {http://doi.ieeecomputersociety.org/10.1109/EWDTS.2010.5742079}, researchr = {https://researchr.org/publication/HaghbayanYKSN10}, cites = {0}, citedby = {0}, pages = {456-461}, booktitle = {2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010}, publisher = {IEEE}, isbn = {978-1-4244-9555-9}, }