The split boundary scan register technique for testing board interconnects

Nazar S. Haider, Nick Kanopoulos. The split boundary scan register technique for testing board interconnects. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 43-48, IEEE, 1992. [doi]

Authors

Nazar S. Haider

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Nick Kanopoulos

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