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Nazar S. Haider, Nick Kanopoulos. The split boundary scan register technique for testing board interconnects. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 43-48, IEEE, 1992. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Efficient board interconnect testing using the split boundary scan registerNazar S. Haider, Nick Kanopoulos. et, 4(2):181-189, 1993. [doi] Multiple boundary scan-paths for minimizing circuit-board test-application timeTheodoros Antonakopoulos, Nick Kanopoulos. jsa, 40(6):377-386, 1994. [doi]
The following publications are possibly variants of this publication: