Nazar S. Haider, Nick Kanopoulos. The split boundary scan register technique for testing board interconnects. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 43-48, IEEE, 1992. [doi]
@inproceedings{HaiderK92,
title = {The split boundary scan register technique for testing board interconnects},
author = {Nazar S. Haider and Nick Kanopoulos},
year = {1992},
doi = {10.1109/VTEST.1992.232722},
url = {http://dx.doi.org/10.1109/VTEST.1992.232722},
researchr = {https://researchr.org/publication/HaiderK92},
cites = {0},
citedby = {0},
pages = {43-48},
booktitle = {10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA},
publisher = {IEEE},
isbn = {0-7803-0623-6},
}