Gradient importance sampling: An efficient statistical extraction methodology of high-sigma SRAM dynamic characteristics - researchr publication authors

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Thomas Haine, Johan Segers, Denis Flandre, David Bol. Gradient importance sampling: An efficient statistical extraction methodology of high-sigma SRAM dynamic characteristics. In 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018. pages 195-200, IEEE, 2018. [doi]

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