Thomas Haine, Johan Segers, Denis Flandre, David Bol. Gradient importance sampling: An efficient statistical extraction methodology of high-sigma SRAM dynamic characteristics. In 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018. pages 195-200, IEEE, 2018. [doi]
@inproceedings{HaineSFB18,
title = {Gradient importance sampling: An efficient statistical extraction methodology of high-sigma SRAM dynamic characteristics},
author = {Thomas Haine and Johan Segers and Denis Flandre and David Bol},
year = {2018},
doi = {10.23919/DATE.2018.8342002},
url = {https://doi.org/10.23919/DATE.2018.8342002},
researchr = {https://researchr.org/publication/HaineSFB18},
cites = {0},
citedby = {0},
pages = {195-200},
booktitle = {2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018},
publisher = {IEEE},
isbn = {978-3-9819263-0-9},
}