On statistical behavior of branch coverage in testing behavioral VHDL models - researchr publication authors

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Amjad Hajjar, Tom Chen, Anneliese von Mayrhauser. On statistical behavior of branch coverage in testing behavioral VHDL models. In Proceedings of the IEEE International High-Level Design Validation and Test Workshop 2000, Berkeley, California, USA, November 8-10, 2000. pages 89-94, IEEE Computer Society, 2000. [doi]

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Anneliese Amschler Andrews

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