Amjad Hajjar, Tom Chen, Anneliese von Mayrhauser. On statistical behavior of branch coverage in testing behavioral VHDL models. In Proceedings of the IEEE International High-Level Design Validation and Test Workshop 2000, Berkeley, California, USA, November 8-10, 2000. pages 89-94, IEEE Computer Society, 2000. [doi]
@inproceedings{HajjarCM00,
title = {On statistical behavior of branch coverage in testing behavioral VHDL models},
author = {Amjad Hajjar and Tom Chen and Anneliese von Mayrhauser},
year = {2000},
doi = {10.1109/HLDVT.2000.889565},
url = {http://doi.ieeecomputersociety.org/10.1109/HLDVT.2000.889565},
researchr = {https://researchr.org/publication/HajjarCM00},
cites = {0},
citedby = {0},
pages = {89-94},
booktitle = {Proceedings of the IEEE International High-Level Design Validation and Test Workshop 2000, Berkeley, California, USA, November 8-10, 2000},
publisher = {IEEE Computer Society},
isbn = {0-7695-0786-7},
}