Specification Based Digital Compatible Built-in Test of Embedded Analog Circuits

Achintya Halder, Abhijit Chatterjee. Specification Based Digital Compatible Built-in Test of Embedded Analog Circuits. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 344, IEEE Computer Society, 2001. [doi]

Authors

Achintya Halder

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Abhijit Chatterjee

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